JPS61108954A - 塗膜測定プロ−ブ - Google Patents

塗膜測定プロ−ブ

Info

Publication number
JPS61108954A
JPS61108954A JP22982284A JP22982284A JPS61108954A JP S61108954 A JPS61108954 A JP S61108954A JP 22982284 A JP22982284 A JP 22982284A JP 22982284 A JP22982284 A JP 22982284A JP S61108954 A JPS61108954 A JP S61108954A
Authority
JP
Japan
Prior art keywords
electrode
coat film
measured
coating film
impedance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP22982284A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0432982B2 (en]
Inventor
Kunio Deguchi
出口　邦雄
Kiyoshi Fukui
清 福井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP22982284A priority Critical patent/JPS61108954A/ja
Publication of JPS61108954A publication Critical patent/JPS61108954A/ja
Publication of JPH0432982B2 publication Critical patent/JPH0432982B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/20—Investigating the presence of flaws
    • G01N27/205—Investigating the presence of flaws in insulating materials

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
JP22982284A 1984-10-31 1984-10-31 塗膜測定プロ−ブ Granted JPS61108954A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22982284A JPS61108954A (ja) 1984-10-31 1984-10-31 塗膜測定プロ−ブ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22982284A JPS61108954A (ja) 1984-10-31 1984-10-31 塗膜測定プロ−ブ

Publications (2)

Publication Number Publication Date
JPS61108954A true JPS61108954A (ja) 1986-05-27
JPH0432982B2 JPH0432982B2 (en]) 1992-06-01

Family

ID=16898209

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22982284A Granted JPS61108954A (ja) 1984-10-31 1984-10-31 塗膜測定プロ−ブ

Country Status (1)

Country Link
JP (1) JPS61108954A (en])

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61265559A (ja) * 1985-05-14 1986-11-25 シエル・インタ−ナシヨナル・リサ−チ・マ−トスハツペイ・ベ−・ヴエ− 試験セル
JPS62130348A (ja) * 1985-09-24 1987-06-12 コ−ルブランド　リミテツド 腐食検出装置
JPH02157642A (ja) * 1988-12-12 1990-06-18 Hideaki Takahashi 金属材料の劣化度評価のための電気化学計測用ジェル電極
JPH04190149A (ja) * 1990-04-09 1992-07-08 Toshiba Corp 塗膜劣化診断装置
JPH04218756A (ja) * 1991-03-29 1992-08-10 Toshiba Corp 塗膜劣化診断方法
JP2007225508A (ja) * 2006-02-24 2007-09-06 Dainippon Toryo Co Ltd 塗膜下金属腐食診断装置の測定セル
EP2068139A1 (en) 2007-12-06 2009-06-10 Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO Electrochemical cell for EIS
JP2009204593A (ja) * 2008-02-29 2009-09-10 Ihi Corp 電解液中での電気化学測定用プローブ及び電気化学測定装置並びにそれを用いた電気化学測定方法
JP2013238583A (ja) * 2012-04-19 2013-11-28 Kansai Paint Co Ltd 電気化学測定用プローブ及び腐食評価方法
JP2017032514A (ja) * 2015-08-05 2017-02-09 太平洋セメント株式会社 腐食センサおよび腐食検出方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013145136A (ja) * 2012-01-13 2013-07-25 Panasonic Corp 試験片の疲労試験方法および疲労試験装置

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61265559A (ja) * 1985-05-14 1986-11-25 シエル・インタ−ナシヨナル・リサ−チ・マ−トスハツペイ・ベ−・ヴエ− 試験セル
JPS62130348A (ja) * 1985-09-24 1987-06-12 コ−ルブランド　リミテツド 腐食検出装置
JPH02157642A (ja) * 1988-12-12 1990-06-18 Hideaki Takahashi 金属材料の劣化度評価のための電気化学計測用ジェル電極
JPH04190149A (ja) * 1990-04-09 1992-07-08 Toshiba Corp 塗膜劣化診断装置
JPH04218756A (ja) * 1991-03-29 1992-08-10 Toshiba Corp 塗膜劣化診断方法
JP2007225508A (ja) * 2006-02-24 2007-09-06 Dainippon Toryo Co Ltd 塗膜下金属腐食診断装置の測定セル
EP2068139A1 (en) 2007-12-06 2009-06-10 Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO Electrochemical cell for EIS
JP2009204593A (ja) * 2008-02-29 2009-09-10 Ihi Corp 電解液中での電気化学測定用プローブ及び電気化学測定装置並びにそれを用いた電気化学測定方法
JP2013238583A (ja) * 2012-04-19 2013-11-28 Kansai Paint Co Ltd 電気化学測定用プローブ及び腐食評価方法
JP2017032514A (ja) * 2015-08-05 2017-02-09 太平洋セメント株式会社 腐食センサおよび腐食検出方法

Also Published As

Publication number Publication date
JPH0432982B2 (en]) 1992-06-01

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